Scanning probe apparatus with in-situ measurement probe tip...

Details Scanning probe apparatus with in-situ measurement probe tip... Scanning probe apparatus with in-situ measurement probe tip...

2007-03-16

2009-08-04

Noland, Thomas P (Department: 2856)

Cleaning and liquid contact with solids

Processes

Including application of electrical radiant or wave energy...

C850S017000

Reexamination Certificate

active

07569112

ABSTRACT:
A scanning probe apparatus includes a measurement probe tip and an auxiliary probe tip that is movably positionable with respect to the measurement probe tip. The measurement probe tip and the auxiliary probe tip may be positioned juxtaposed, so that an electrical discharge may be effected between the measurement probe tip and auxiliary probe tip to remove a contaminant from the measurement probe tip. The auxiliary probe tip may be integral with a sample support plate within the scanning probe apparatus.

REFERENCES:
patent: 7495240 (2009-02-01), Hopkins et al.
patent: 2007/0131249 (2007-06-01), Nakaue
patent: 736746 (1996-10-01), None
patent: WO 2006035403 (2006-04-01), None
CO2 Snow Jet Cleaning, [online], [retrieved on Dec. 21, 2006]. Retrieved from the Internet<URL: www.polymer-physics/uwaterloo.ca/equipment/CO2snow.htm>, 1 page.
de Souza et al., “Implementation of Recycling Routes for Scanning Probe Microscopy Tips,” Microsc. Microanalysis, 8, 2002, pp. 509-517, substantially illegible due to photocopy quality.
Senden et al., Plasma Reactor, [online], [retrieved on Dec. 21, 2006]. Retrieved from the Internet <URL: www.rsphysse.anu.edu.au/˜tjsl10/plasma.html>, 4 pages.
Electric Field to Produce Spark in Air—Dielectric Breakdown, The Physics Factbook, Elert ed., [online], [retrieved on Aug. 25, 2006]. Retrieved from the Internet <URL: http://hypertextbook.com/facts/2000/AliceHong.shtml.>, dated 2000, 2 pages, by Alice Hong.

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