Scanning optical system and image forming apparatus using...

Optical: systems and elements – Deflection using a moving element – Using a periodically moving element

Reexamination Certificate

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C359S204200, C359S216100, C347S244000, C347S259000

Reexamination Certificate

active

06885486

ABSTRACT:
Provided is a scanning optical system in which the influence of structural birefringence resulting from a relationship between the arrangement direction of a fine grating structure and polarization planes is reduced to obtain a preferable optical performance, and an image forming apparatus using the scanning optical system. In the scanning optical system, a light flux emitted from a light source unit is deflected by a deflection unit. The light flux deflected by the deflection unit is guided onto a surface to be scanned by a scanning optical unit having a fine structural grating on at least one optical surface. The surface to be scanned is scanned with the light flux. The fine structural grating has a triangular grating in which triangular grating parts are arranged in one dimensional direction. When a grating height of a triangular structure of the triangular grating is given by h, a grating pitch thereof is given by P, and a wavelength of the light flux emitted from the light source unit is given by λ, conditions of 0.23λ≦h and 0.52<h/P are satisfied.

REFERENCES:
patent: 6215574 (2001-04-01), Toyoda
patent: 6222661 (2001-04-01), Takeuchi et al.
patent: 20020179827 (2002-12-01), Kimura
patent: 11218699 (1999-08-01), None
patent: 2000206445 (2000-07-01), None
E. Grann, et al., “Artificial uniaxial and biaxial dielectrics with use of two-dimensional subwavelength binary gratings”, J. Opt. Soc. Am., vol. 11, No. 10, pp. 2695 to 2703 (1994).
“Principle of Optics III”, Tokai University Press, p. 1030, no date.
“Principle of Optics III”, Tokai University Press, p. 1030 (with English-language translation), no date.

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