Scanning optical microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C359S384000

Reexamination Certificate

active

11225098

ABSTRACT:
A scanning optical microscope using a wavefront converting element suffers minimum off-axis performance degradation and allows the wavefront converting element to be controlled by a simple method. Further, a pupil relay optical system is simple in arrangement or unnecessary. A laser scanning microscope includes a laser oscillator and a wavefront converting element for applying a desired wavefront conversion to a laser beam emitted from the laser oscillator. An objective collects a wavefront-converted approximately parallel laser beam emerging from the wavefront converting element onto a sample. A detector detects signal light emitted from the sample. An actuator scans the objective along a direction perpendicular to the optical axis.

REFERENCES:
patent: 4579430 (1986-04-01), Bille
patent: 5399866 (1995-03-01), Feldman et al.
patent: 5777719 (1998-07-01), Williams et al.
patent: 6381074 (2002-04-01), Yoshida
patent: 6771417 (2004-08-01), Wolleschensky et al.
patent: 6890076 (2005-05-01), Roorda
patent: 2002/0044332 (2002-04-01), Engelhardt et al.
patent: 2003/0137725 (2003-07-01), Mueller et al.
patent: HEI-11-101942 (1999-04-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scanning optical microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning optical microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning optical microscope will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3793603

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.