Scanning near field optical microscope based on the use of polar

Details Scanning near field optical microscope based on the use of polar Scanning near field optical microscope based on the use of polar

1998-05-21

2000-04-04

Allen, Stephone B.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250225, 250306, 354369, H01J 314

Patent

active

060464488

ABSTRACT:
An optical fiber probe which has a minute opening on the top of a sharpened tip is allowed to get close to a sample, and the probe is moved by a piezo actuator along x- and y-axis directions so that a minute spot beam emanating from the minute opening can scan over the sample. For circular polarization modulation to be incorporated in the process, a beam, before it is incident on the optical fiber probe, is given an optical delay changing at a frequency of p (Hz) by means of a piezo-optical modulator. A minute spot beam emanating from the minute opening passes through the sample to be received after the passage through an analyzer by a light receiving element. The output from the light receiving element is fed to a lock-in amplifier, p- and 2p-components are separated through lock-in rectification, and they are rendered images by a controller.

REFERENCES:
patent: 5457536 (1995-10-01), Kornfield et al.
patent: 5664036 (1997-09-01), Islam
patent: 5877891 (1999-03-01), Park et al.
patent: 5960147 (1999-09-01), Muramatsu et al.
Journal of Magnetism and Magnetic Materials, vol. 165, No. 1, Jan., 1997, V. Kottler et al., pp. 398-400, "Dichroic Imaging of Magnetic Domains With a Scanning Near-Field Optical Microscope".
Applied Physics Letters, vol. 65, No. 6, Aug. 1994, T. J. Silva et al., pp. 658-660, "Scanning Near-Field Optical Microscope for the Imaging of Magnetic Domains in Optically Opaque Materials".

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