Scanning microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S834000

Reexamination Certificate

active

07433119

ABSTRACT:
In a scanning microscope that impinges upon a sample with a first light pulse and a second light pulse, a dispersive medium that modifies the time offset between the first and the second light pulse is provided in the beam path of at least one of the light pulses.

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T.A. Klar et al., “Fluorescence Microscopy with Diffraction Resolution Barrier broken by Stimulated Emission”, PNAS, 2000, vol. 97, pp. 8206-8210.

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