Scanning microscope

Details Scanning microscope Scanning microscope

2006-12-19

2006-12-19

Amari, Alessandro (Department: 2872)

Optical: systems and elements

Compound lens system

Microscope

C359S368000, C356S073000, C356S318000

Reexamination Certificate

active

07151633

ABSTRACT:
A detector, arranged in the detection beam path of a scanning microscope, for the detection of detected light proceeding from a sample can be used to detect other than the detected light for example of external optical experiments. The scanning microscope comprises an incoupling apparatus with which light other than the detected light can be coupled into the detection beam path and conveyed to the detector.

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patent: WO 92/00540 (2002-01-01), None

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