Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2006-12-19
2006-12-19
Amari, Alessandro (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C356S073000, C356S318000
Reexamination Certificate
active
07151633
ABSTRACT:
A detector, arranged in the detection beam path of a scanning microscope, for the detection of detected light proceeding from a sample can be used to detect other than the detected light for example of external optical experiments. The scanning microscope comprises an incoupling apparatus with which light other than the detected light can be coupled into the detection beam path and conveyed to the detector.
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Knebel Werner
Storz Rafael
Amari Alessandro
Darby & Darby
Leica Microsystems CMS GmbH
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