Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2005-07-20
2009-02-17
Nguyen, Thong (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S384000, C359S385000, C250S201300
Reexamination Certificate
active
07492511
ABSTRACT:
The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.
REFERENCES:
patent: 5049740 (1991-09-01), Pines et al.
patent: 6677566 (2004-01-01), Knebel et al.
patent: 2003/0095329 (2003-05-01), Engelhardt
patent: 2004/0036872 (2004-02-01), Engelhardt
patent: 202 16 583 (2003-01-01), None
patent: 102 51 151 (2004-05-01), None
patent: 2006-3394 (2006-01-01), None
Knebel Werner
Widzgowski Bernd
Houston Eliseeva LLP
Leica Microsystems CMS GmbH
Nguyen Thong
LandOfFree
Scanning microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4124102