Scanning microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C359S384000, C359S385000, C250S201300

Reexamination Certificate

active

07492511

ABSTRACT:
The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.

REFERENCES:
patent: 5049740 (1991-09-01), Pines et al.
patent: 6677566 (2004-01-01), Knebel et al.
patent: 2003/0095329 (2003-05-01), Engelhardt
patent: 2004/0036872 (2004-02-01), Engelhardt
patent: 202 16 583 (2003-01-01), None
patent: 102 51 151 (2004-05-01), None
patent: 2006-3394 (2006-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scanning microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning microscope will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4124102

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.