Scanning mass spectrometer having constant magnetic field

Details Scanning mass spectrometer having constant magnetic field Scanning mass spectrometer having constant magnetic field

1976-09-08

1978-01-03

Borchelt, Archie R.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250396R, H01J 3934, H01J 3726

Patent

active

040668959

ABSTRACT:
A mass spectrometer wherein the ion beam is deflected for scanning of a mass spectrum or selection of mass numbers, without changing the magnetic field strength and the ion-accelerating voltage. The means for deflecting the ion beam may be arranged between the ion source and the magnetic field or within the magnetic field or between the magnetic field and the ion detector.

REFERENCES:
patent: 3641339 (1972-02-01), McCormick
patent: 3840743 (1974-10-01), Tamura
Christie et al., "A New High-Resolution Mass Spectrometer with Partial Second-Order Double Focusing," International Journal of Mass Spectrometry and Ion Physics, vol. 8, No. 4, (1972), pp. 311-321.

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