Electricity: measuring and testing – Magnetic – Magnetometers
Reexamination Certificate
2006-12-05
2006-12-05
Vanore, David A. (Department: 2881)
Electricity: measuring and testing
Magnetic
Magnetometers
C324S247000, C250S306000
Reexamination Certificate
active
07145330
ABSTRACT:
A scanning magnetic microscope SMM (20) includes a sensor (10) for sensing a magnetic field generated by a specimen (78), the sensor including one of a MTJ, a GMR, or an EHE sensor; translation apparatus (22A–C,52) for translating the sensor relative to a surface of sad specimen; and a data processor (50), having an input coupled to an output of said sensor, for constructing an image of said magnetic field. The sensor preferably includes one to three sensing units each defining a sensing axis for sensing a component of a magnetic field from a specimen, the sensing units disposed such that the sensing axes are orthogonal to one another. Pluralities of such sensors can be disposed in two or three dimensional arrays. The SMM can be used for examining the current flow in ICs, electromigration, magnetic data storage media, biomagnetic systems and magnetic ink used to print currency.
REFERENCES:
patent: 4588946 (1986-05-01), Lin
patent: 5038104 (1991-08-01), Wikswo, Jr. et al.
patent: 5171992 (1992-12-01), Clabes et al.
patent: 5465046 (1995-11-01), Campbell et al.
patent: 5491411 (1996-02-01), Wellstood et al.
patent: 5508517 (1996-04-01), Onuki et al.
patent: 5543988 (1996-08-01), Brady et al.
patent: 5589780 (1996-12-01), Ueda et al.
patent: 5650958 (1997-07-01), Gallagher et al.
patent: 5652445 (1997-07-01), Johnson
patent: 5750989 (1998-05-01), Lindsay et al.
patent: 5793743 (1998-08-01), Duerig et al.
patent: 5834938 (1998-11-01), Odawara et al.
patent: 5841692 (1998-11-01), Gallagher et al.
patent: 5856617 (1999-01-01), Gurney et al.
patent: 5862022 (1999-01-01), Noguchi et al.
patent: 5966012 (1999-10-01), Parkin
patent: 6005753 (1999-12-01), Fontana, Jr. et al.
patent: 6118284 (2000-09-01), Ghoshal et al.
patent: 6150809 (2000-11-01), Tiernan et al.
patent: 6165287 (2000-12-01), Sato et al.
patent: 6237399 (2001-05-01), Shivaram et al.
patent: 6266218 (2001-07-01), Carey et al.
patent: 6297630 (2001-10-01), Dietzel et al.
patent: 6396261 (2002-05-01), Martchevskii et al.
patent: 6448766 (2002-09-01), Berger et al.
patent: 6495275 (2002-12-01), Kamiguchi et al.
patent: 6657431 (2003-12-01), Xiao
patent: 6696833 (2004-02-01), Hong et al.
patent: 6717402 (2004-04-01), Mukasa et al.
patent: 6809516 (2004-10-01), Li et al.
patent: 6817231 (2004-11-01), Yasutake et al.
patent: 6822443 (2004-11-01), Dogaru
patent: 6917198 (2005-07-01), Johnson et al.
patent: 6930479 (2005-08-01), Xiao et al.
patent: 6933717 (2005-08-01), Dogaru et al.
patent: 6943574 (2005-09-01), Altmann et al.
patent: 6947788 (2005-09-01), Gilboa et al.
patent: 2003/0076094 (2003-04-01), Hoshino
S. Ingvarsson, et al.; “Electronic Noise in Magnetic Tunnel Junctions”, American Institute of Physics, Journal of Applied Physics, vol. 85, No. 8, Apr. 15, 1999, pp. 5270-5272.
Daniel S. Reed, et al.; “Low Frequency Noise in Magnetic Tunnel Junctions”, IEEE Transactions on Magnetics, vol. 37, No. 4, Jul. 2001, pp. 2028-2030.
S. Ingvarsson, et al.; “Low-Frequency Magnetic Noise in Micron-Scale Magnetic Tunnel Junctions”, The American Physical Society, Physical Review Letters, Oct. 9, 2000, vol. 85, No. 15, pp. 3289-3292.
Michael K. Ho, et al.; “Study of Magnetic Tunnel Junction Read Sensors”, IEEE Transactions on Magnetics, vol. 37, No. 4, Jul. 2001, pp. 1691-1694.
Jian Qing Wang, et al.; “Large finite-size effect of giant magnetoresistance in magnetic granular thin films”, Physical Review B (Condensed Matter), vol. 51, No. 9, Mar. 1995(Abstract).
B.L.T. Plourde, et al.; “Design of a Scanning Josephson Junction Microscope for Submicron-Resolution Magnetic Imaging”, Review of Scientific Instruments, vol. 70, No. 11, Nov. 1999, pp. 4344-4347.
S.Y. Yamamoto, et al.; “Scanning Magnetoresistance Microscopy”, American Institute of Physics, Applied Physics Letters, 69, (21), Jun. 10, 1996, pp. 3263-3265.
E.R. Norwak, et al.; “Noise Properties of Ferromagnetic Tunnel Junctions”, American Institute of Physics, Applied Physics Letters, vol. 84, No. 11, Dec. 1, 1998, pp. 6195-6201.
http://www.neocera.com/html-files/magma/magma.htm, Unprecedented Accuracy in Location of buried Faults, Oct. 30, 1999, Neocera.
Honeywell Sensor Products 1-and 2-Axis Magnetic Sensors HMC1001/1002 HMC1021/1022, 900248 Rev. B, Apr. 2002.
Honey Well Sensor Products Three Axis Magnetic Sensor Hybrid HMC2003,900151 Rev. C, Oct. 1997.
Brown University Research Foundation
Harrington & Smith ,LLP
Vanore David A.
LandOfFree
Scanning magnetic microscope having improved magnetic sensor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning magnetic microscope having improved magnetic sensor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning magnetic microscope having improved magnetic sensor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3719807