Scanning laser microscope system and methods of use

Facsimile and static presentation processing – Static presentation processing – Attribute control

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324158R, 358199, 358206, H04N 718

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active

049722581

ABSTRACT:
A scanning laser microscope system for assisting in the detection and characterization of fine details and structures of materials or other samples. The system can have means for enhancing light from the material to assist detection of anomalies, such as inclusions in the material and crystal lattice dislocations. The system can have means for enhancing fluorescent light emitted from the sample. The system can further have very precise means for processing signals representative of light detected from the material.

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