Scanning infrared thermometer with DC offset and emissivity corr

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen

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374124, 374129, 356 43, G01J 556

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active

050945440

ABSTRACT:
A scanning infrared sensor (10) in which the scanner (21), detector (32) and temperature converter (35) are all contained in proximity with one another in a single housing assembly (18) enables correction of both emissivity based on emissivity settings (41) for each of a plurality of spot targets (16') along a scan line (16) and correction for DC offset errors based on reference temperature measurement (45) of hot and cold references (34, 36). Correction is performed before digital conversion by an A/D converter (56) by a nulling circuit (46), a programmable gain circuit (50) and a bias circuit (62) to produce corrected digital temperature signals on a plurality of output ports (26) respectively associated to a plurality of spot targets (16') along a scan line (16) on a target (12) which are individually connectable with a multiple temperature display (27), a temperature recorder (28) and a process control (30).

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