Scanning electron microscope having multiple detectors and a...

Radiant energy – With charged particle beam deflection or focussing – With detector

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S307000, C250S310000

Reexamination Certificate

active

07847267

ABSTRACT:
A system and method for multi detector detection of electrons, the method includes the steps of directing a primary electron beam, through a column, to interact with an inspected object, directing, by introducing a substantial electrostatic field, electrons reflected or scattered from the inspected objects towards multiple interior detectors, whereas at least some of the directed electrons are reflected or scattered at small angle in relation to the inspected object; and receiving detection signals from at least one interior detector.

REFERENCES:
patent: 3849659 (1974-11-01), O'Keeffe
patent: 4321510 (1982-03-01), Takigawa
patent: 4896036 (1990-01-01), Rose et al.
patent: 4926054 (1990-05-01), Frosien
patent: 5329125 (1994-07-01), Feuerbaum
patent: 5481109 (1996-01-01), Ninomiya et al.
patent: 5627373 (1997-05-01), Keese
patent: 5659172 (1997-08-01), Wagner et al.
patent: 5734164 (1998-03-01), Sanford
patent: 5894124 (1999-04-01), Iwabuchi et al.
patent: 5895917 (1999-04-01), Ueda et al.
patent: 5900629 (1999-05-01), Todokoro et al.
patent: 5939720 (1999-08-01), Todokoro
patent: 5952667 (1999-09-01), Shimizu
patent: 6037589 (2000-03-01), Yonezawa et al.
patent: 6064486 (2000-05-01), Chen et al.
patent: 6066853 (2000-05-01), Nakasuji
patent: 6084238 (2000-07-01), Todokoro et al.
patent: 6172365 (2001-01-01), Hiroi et al.
patent: 6184526 (2001-02-01), Kohama et al.
patent: 6194729 (2001-02-01), Weimer
patent: 6232601 (2001-05-01), Schmitt et al.
patent: 6353222 (2002-03-01), Dotan
patent: 6365897 (2002-04-01), Hamashima et al.
patent: 6407388 (2002-06-01), Frosien
patent: 6407396 (2002-06-01), Mih et al.
patent: 6452175 (2002-09-01), Adamec
patent: 6463184 (2002-10-01), Gould et al.
patent: 6489068 (2002-12-01), Kye
patent: 6498068 (2002-12-01), Ueda et al.
patent: 6501077 (2002-12-01), Sawahata et al.
patent: 6555819 (2003-04-01), Suzuki et al.
patent: 6589385 (2003-07-01), Minami et al.
patent: 6590210 (2003-07-01), Essers
patent: 6635873 (2003-10-01), Todokoro et al.
patent: 6646262 (2003-11-01), Todokoro et al.
patent: 6674075 (2004-01-01), Petrov et al.
patent: 6730907 (2004-05-01), Feuerbaum et al.
patent: 6778275 (2004-08-01), Bowes
patent: 6787772 (2004-09-01), Ose et al.
patent: 6897442 (2005-05-01), Petrov
patent: 7045781 (2006-05-01), Adamec et al.
patent: 7223974 (2007-05-01), Petrov et al.
patent: 2001/0010362 (2001-08-01), Simizu
patent: 2002/0179851 (2002-12-01), Sato et al.
patent: 2002/0185599 (2002-12-01), Kimura et al.
patent: 2003/0116717 (2003-06-01), Knippelmeyer
patent: 2003/0205678 (2003-11-01), Notte, IV
patent: 1 045 426 (2000-10-01), None
patent: 1 263 018 (2002-12-01), None
patent: 09-171791 (1997-06-01), None
patent: 2000 156189 (2000-06-01), None
patent: 1998-081497 (1998-11-01), None
patent: 99/26272 (1999-05-01), None
patent: 99/46797 (1999-09-01), None
patent: 01/45136 (2001-06-01), None
patent: 02/37523 (2002-05-01), None
Applied Materials, Inc., PCT/US03/14974 filed May 12, 2003, International Search Report, Jan. 27, 2004, ISA-EP, 6pp.
Applied Materials Israel, Ltd.; CN Application No. 2003801104084 filed Oct. 22, 2003, Office Action dated Mar. 6, 2009, 5pp.
Applied Materials Israel, Ltd.; CN Application No. 2003801104084 filed Oct. 22, 2003, Office Action dated Feb. 5, 2010, 3pp.
Applied Materials Israel, Ltd.; JP Application No. 2005-507924 filed Oct. 22, 2003, Office Action dated Sep. 15, 2009, 4pp.
Applied Materials Israel, Ltd.: PCT/US2004/012468 Filed Apr. 22, 2004; International Search Report and Written Opinion; ISA/EP; Oct. 29, 2004; 16pp.
Applied Materials Israel, Ltd.: PCT/US2004/012468 Filed Apr. 22, 2004; International Preliminary Report on Patentability; International Bureau of WIPO; Nov. 10, 2005; 10pp.
Frosien J., et al.; “Compound Magnetic and Electrostatic Lenses for Low-Voltage Applications”; Journal of Vacuum Science and Technology: Part B, American Institute of Physics. New York, US, vol. 7, No. 6, Nov. 1, 1989, pp. 1874-1877.
Applied Materials Israel, Ltd.: PCT/US2003/015018 Filed May 12, 2003; International Search Report; ISA/EP; Jan. 26, 2004; 9pp.
Patent Abstracts of Japan, Oct. 12, 2001, JP 2001283759 1pg.
Patent Abstracts of Japan, vol. 1999, No. 11, Sep. 30, 1999, JP 11 162384 1pg.
Patent Abstracts of Japan, vol. 01, No. 385 (P-1094), Aug. 20, 1990—& JP 02 145947 A (Shimadzu Corp), Jun. 5, 1990, abstract; figure 1.
United States Patent Application entitled: A Focusing Assembly and Method for a Charged Particle Beam Column.
Patent Abstracts of Japan, vol. 1998, No. 13, Nov. 30, 1998—& JP 10 214586 A (Horon: KK), Aug. 11, 1998, abstract; figures 1, 2.
Applied Materials Israel, Ltd.; Korean Application No. 10-2006-7001930, Office Action dated Jul. 28, 2010, 6pp.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scanning electron microscope having multiple detectors and a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning electron microscope having multiple detectors and a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning electron microscope having multiple detectors and a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4185553

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.