Scanning differential phase contrast microscope

Details Scanning differential phase contrast microscope Scanning differential phase contrast microscope

1987-12-08

1989-07-04

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

250216, 350507, G01J 120

Patent

active

048453528

ABSTRACT:
An objective system (20) focusses the radiation from a radiation source (10) to a diffraction-limited spot (A) which is imaged on two point detectors (61, 62) by an imaging system (40) and a beam divider (60). By using this confocal principle, a differential phase contrast microscope is obtained having a low sensitivity to details which are out of focus, an increased resolution in the object plane and little crosstalk between the two detectors.

REFERENCES:
patent: 3969576 (1976-07-01), Boonstra et al.
patent: 4631397 (1986-12-01), Ohsato et al.
patent: 4689479 (1987-08-01), Tatsuno et al.

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