Scanning circuit for pressure responsive array

Measuring and testing – Instrument proving or calibrating – Volume of flow – speed of flow – volume rate of flow – or mass...

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73 1B, 73719, 73862045, 73862046, 36457105, G01L 2700, G01L 1500, G01L 902

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active

055050727

ABSTRACT:
A scanning circuit for an array of pressure responsive sensor points which permits the sensitivity of the circuit to be controlled. In particular, the sensitivity of the circuit may be controlled by controlling a test and/or reference voltage used with the circuit and different sensitivity or resolutions may be provided for different areas of the array. The circuit also provides enhanced interelectrode isolation, permitting a single test voltage to be utilized to scan all sensor points on a given input electrode and further reduces the time required to scan the array by reducing trace capacitance discharge time and by inhibiting processing for sensor points which are not of interest. The accuracy of pressures being sensed is also enhanced by adjusting the test voltage to compensate for load variations.

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Patent Abstracts of Japan Grp P178, vol. 7, No. 48 Abs Pub. date Feb. 24, 1983 (57-196385) "Scanning System for Electronic Blackboard System".
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