Dynamic information storage or retrieval – Condition indicating – monitoring – or testing – Including radiation storage or retrieval
Patent
1985-12-19
1987-07-07
Psitos, Aristotelis M.
Dynamic information storage or retrieval
Condition indicating, monitoring, or testing
Including radiation storage or retrieval
369126, 250307, 250311, 324 64, 358342, G11B 906
Patent
active
RE0324574
ABSTRACT:
Variations in topography and material properties of the surface layer of a body are observed in microscopic imaging using a scanning capacitance probe. The acronym SCaM identifying the process and apparatus is derived from the phrase scanning capacitance microscope. The material properties observable by SCaM are the surface-electric property representative of the complex dielectric constant of the surface material and the surface-mechanical property representative of the elastic constant of the surface material.
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Cohen Donald S.
Psitos Aristotelis M.
RCA Corporation
Tripoli Joseph S.
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