Scanning beam deflection system and method

Details Scanning beam deflection system and method Scanning beam deflection system and method

1979-08-06

1981-07-28

Anderson, Bruce C.

Radiant energy

With charged particle beam deflection or focussing

With target means

250492B, H01G 3700

Patent

active

042812518

ABSTRACT:
A scanning beam deflection system and method utilizes a beam scanning device for producing rays diverging from a central axis of a beam of charged particles and a deflection magnet assembly for deflecting the scanning beam substantially 270.degree. within an evacuated deflection chamber such that the deflected scanning beam exits an offset beam window in the deflection chamber and has rays diverging from the central axis of the deflected scanning beam at substantially the same angle as the diverging rays produced by the beam scanning device. The system and method is particularly useful for irradiating internal surfaces of hollow articles with the deflection chamber and deflection magnet assembly disposed along an axis of symmetry of the object.

REFERENCES:
patent: 2777958 (1957-01-01), LePoole
patent: 3094474 (1963-06-01), Gale
patent: 3714416 (1973-01-01), Link et al.
patent: 4075496 (1978-02-01), Uehara

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