Scanning beam control system with translated reference scale

Details Scanning beam control system with translated reference scale Scanning beam control system with translated reference scale

1990-12-07

1993-03-02

Coles, Sr., Edward L.

Facsimile and static presentation processing

Facsimile

Picture signal generator

358474, 358481, 358494, 250234, 250235, H04N 104

Patent

active

051914476

ABSTRACT:
A scanning system, having a fixed platen and optical imaging system and a translated reference scale, is provided for scanning of a modulated light beam (or a set of parallel, independently modulated light beams) onto an object surface. The optical system provides a combined light beam including the modulated light beam and a reference light beam. An optical imaging device moves the combined light beam along a scan line, and a translatably mounted beam splitter splits the combined light beam to direct at least some of the reference light beam onto a reference scale and a sensor. The reference scale sensor, which is rigidly attached to the beam splitter, and is responsive to reference beam position in two directions, provides a clocking signal indicative of beam position along the scan line and a vernier position signal indicative of beam position in a direction transverse to the scan line. An optical stepper controls the translation of the beam splitter such as to position precisely each of a series of scans in a direction transverse to the scan lines.

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patent: 4827126 (1989-05-01), Tanaka
patent: 4832429 (1989-05-01), Nagler
patent: 4931637 (1992-06-01), Succari et al.

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