Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1986-03-12
1989-01-17
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356334, G01J 308, G01J 310, G01J 336
Patent
active
047984643
ABSTRACT:
The advantage of sustained wavelength accuracy and mechanical simplicity of a spectrophotometer using a photodiode array as photometric detector and a fixed diffraction grating as dispersion means may be limited to a relatively short wavelength range by problems of stray light, second order errors and overloading of the detector at portions of the wavelength range. By utilizing repeat scanning of the array, each scan being modified by using a different source lamp and correction filters, freedom from the cited problems over part of each scanned wavelength range can be effected. A computer controls the scan sequence and combines the usable portion of each scan to produce error free operation over an extended range.
REFERENCES:
patent: 4330210 (1982-05-01), Hashimoto et al.
patent: 4563090 (1986-01-01), Witte
patent: 4613233 (1986-09-01), Wilson
patent: 4692883 (1987-09-01), Nelson et al.
Malone et al "An Interactive Microprocessor-Controlled Spectrophotometer" Am. Lab (USA), Jun. 1980 vol. 12 #6, pp. 76-81.
Cummings Ronald G.
Grimes Edwin T.
Masselle Francis L.
McGraw Vincent P.
The Perkin-Elmer Corporation
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