Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2008-01-01
2008-01-01
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Reexamination Certificate
active
10887568
ABSTRACT:
A method for 3 dimensional scanning using a light source for projecting a source of illumination configured to be non-uniform or having a predetermined pattern is disclosed. A CMOS sensor having randomly accessible rows of pixels, and an associated lens system, is mounted above a workpiece, with the workpiece and sensor movable with respect to each other in a scanning relation. Rows of pixels of the sensor are selected for registering reflected light, with data from the selected rows provided to a computer for calculating height information of features of the workpiece. Significantly, both 2 dimensional and 3 dimensional images may be generated during a single scanning pass because of the non-uniform source of light and random access capabilities of the sensor.
REFERENCES:
patent: 5237404 (1993-08-01), Tanaka et al.
patent: 5652658 (1997-07-01), Jackson et al.
patent: 6392754 (2002-05-01), Pingel et al.
patent: 6639685 (2003-10-01), Gu et al.
patent: 6980302 (2005-12-01), Knighton et al.
patent: 2001/0021026 (2001-09-01), Liu
patent: 2004/0046966 (2004-03-01), Fujita
patent: 2004/0156043 (2004-08-01), Toker et al.
patent: 2004/0201856 (2004-10-01), Quadling et al.
Akanbi Isiaka O
Chowdhury Tarifur
Clodfelter Mark
LandOfFree
Scanning 3D measurement technique using structured lighting... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning 3D measurement technique using structured lighting..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning 3D measurement technique using structured lighting... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3912422