Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-17
2007-04-17
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S612000, C324S1540PB, C600S547000
Reexamination Certificate
active
11179873
ABSTRACT:
The resolution and contrast of impedance measurements and scans are improved by using a non-contact impedance probe comprising an inner conductor configured to bear a measurement signal and an outer conductor configured to bear a shielding signal. The measurement signal and shielding signal are selected to increase the directionality of the flux emitted from the impedance probe. In one embodiment, the measurement signal and the shielding signal are phase locked signals. A sample may be placed in a basin having a conductive surface that receives the flux emitted from the impedance probe. By filling the basin with a conductive solution, direct contact between the probe and the sample may be avoided along with the associated variability in contact resistance. The small highly-directional flux emitting area achievable with the present invention enables high resolution high contrast non-contact scanning of biological and non-biological materials.
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Hawkins Aaron
Oliphant Travis
Schultz Stephen
Brigham Young University
Chan Emily Y
McDaniel Steve
Nguyen Ha Tran
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