Scanned-beam imager with phase offset photon emission imaging

Details Scanned-beam imager with phase offset photon emission imaging Scanned-beam imager with phase offset photon emission imaging

2006-03-17

2008-05-20

Le, Que T (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

C250S208100

Reexamination Certificate

active

07375311

ABSTRACT:
Aspects of the subject matter described herein relate to attributing light emissions to spots a light was scanned over. In aspects, the scanned light includes light capable of increasing light emissions from at least one type of matter. A detector detects emitted light that comes from spots the light was previously scanned over. Circuitry attributes emitted light with spots within the area. Data representing light that reflects from each spot may be combined with data representing light that emits (if any) from each spot to create an image. The emitted light may be assigned a false color in the image to distinguish it from reflected light in the image. Emitted light may occur as a result of fluorescent activity. Other aspects are described in the specification.

REFERENCES:
patent: 5751839 (1998-05-01), Drocourt et al.
patent: 5952668 (1999-09-01), Baer

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