Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1990-11-05
1992-07-14
Miller, Stanley D.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
3072721, 324158R, 371 223, H03K 3289, H03K 3286
Patent
active
051305682
ABSTRACT:
A scannable latch system comprises a plurality of scannable latches and clock driver circuit that allow at-speed testing of integrated circuits. Each scannable latch comprises a master latch, a slave latch and an auxiliary latch. The master latch is a two input latch capable of receiving data from two sources. The output of the master latch is coupled to the input of the slave and auxiliary latches. The clock driver circuitry receives a clock and control signals which are transformed into signals that operate the scannable latch in three different modes. In the normal mode, the slave latch is transparent and the data is held primarily in the master latch. In the scan mode, data may be shifted into the master, shifted out through the auxiliary latch, or shifted both in and out with a propagate function. Finally, in a test mode independent data values may be stored in the master latch and the slave latch.
REFERENCES:
patent: 3539836 (1970-11-01), Seelbach et al.
patent: 3984702 (1976-10-01), Fett
patent: 4258273 (1981-03-01), Straznicky et al.
patent: 4357703 (1982-11-01), Van Brunt
patent: 4419762 (1983-12-01), Paul
patent: 4424581 (1984-01-01), Kawai
patent: 4495628 (1985-01-01), Zasio
patent: 4495629 (1985-01-01), Zasio et al.
patent: 4540903 (1985-09-01), Cooke et al.
patent: 4553236 (1985-11-01), Zasio et al.
patent: 4587480 (1986-05-01), Zasio
patent: 4621363 (1986-11-01), Blum
patent: 4646331 (1987-02-01), Ely
patent: 4782283 (1988-11-01), Zasio
patent: 4785200 (1988-11-01), Huntington
patent: 4912709 (1990-03-01), Teske et al.
patent: 5015875 (1991-05-01), Giles et al.
Cooke Laurence H.
Miller Brent W.
Walker William W.
Cunningham Terry D.
Miller Stanley D.
Smith A. C.
Sueoka Greg T.
Vertex Semiconductor Corporation
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