Scannable detector system for echelle grating spectrometers

Details Scannable detector system for echelle grating spectrometers Scannable detector system for echelle grating spectrometers

1981-03-23

1983-07-05

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356306, G01J 334, G01J 338

Patent

active

043915230

ABSTRACT:
A scannable detector system for echelle grating spectrometers is disclosed in which a photodetector is positioned behind an aperture plate having a plurality of apertures corresponding to focal positions of the spectral array eminating from the grating. The detector is arranged to scan from aperture to aperture to measure the presence of individual wavelengths in the array. Additionally, the detector may be removed from the field of the plate to permit the substitution of a non-scannable array of detectors and an associated masking aperture plate to simultaneously measure the presence of a plurality of wavelengths in the spectral array.

REFERENCES:
patent: 1727173 (1929-09-01), Muller
patent: 2572119 (1951-10-01), Dieke
patent: 2686894 (1954-08-01), Mathieu
patent: 3829218 (1974-08-01), Alyanak
patent: 4049353 (1977-09-01), Missio
patent: 4279511 (1981-07-01), Maute et al.

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