Scan tool

Details Scan tool Scan tool

2007-01-12

2008-03-04

Davis, Antoine D. (Department: 2915)

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

Design Patent

active

D0563249

CLAIM:
The ornamental design for a scan tool, as shown and described.

REFERENCES:
patent: 5491418 (1996-02-01), Alfaro et al.
patent: 5506772 (1996-04-01), Kubozono et al.
patent: 5519397 (1996-05-01), Chapotot et al.
patent: 5532927 (1996-07-01), Pink et al.
patent: 5541840 (1996-07-01), Gurne et al.
patent: 5657233 (1997-08-01), Cherrington et al.
patent: 5758300 (1998-05-01), Abe
patent: 5875413 (1999-02-01), Vinci
patent: 5916286 (1999-06-01), Seashore et al.
patent: 5935180 (1999-08-01), Fieramosca et al.
patent: 6021366 (2000-02-01), Fieramosca et al.
patent: 6061638 (2000-05-01), Joyce
patent: 6097998 (2000-08-01), Lancki
patent: 6141608 (2000-10-01), Rother
patent: 6225898 (2001-05-01), Kamiya et al.
patent: 6263268 (2001-07-01), Nathanson
patent: 6263322 (2001-07-01), Kirkevold et al.
patent: 6314422 (2001-11-01), Barker et al.
patent: 6359442 (2002-03-01), Henningson et al.
patent: 6370454 (2002-04-01), Moore
patent: 6389337 (2002-05-01), Kolls
patent: 6434455 (2002-08-01), Snow et al.
patent: 6459969 (2002-10-01), Bates et al.
patent: 6535802 (2003-03-01), Kramer
patent: 6594579 (2003-07-01), Lowrey et al.
patent: 6604033 (2003-08-01), Banet et al.
patent: 6611740 (2003-08-01), Lowrey et al.
patent: 6636790 (2003-10-01), Lightner et al.
patent: 6680675 (2004-01-01), Suzuki
patent: 6687584 (2004-02-01), Andreasen et al.
patent: 6701233 (2004-03-01), Bertosa et al.
patent: 6718425 (2004-04-01), Pajakowski et al.
patent: 6771073 (2004-08-01), Henningson et al.
patent: 6807469 (2004-10-01), Funkhouser et al.
patent: D499034 (2004-11-01), Bras et al.
patent: 6823243 (2004-11-01), Chinnadurai et al.
patent: 6832141 (2004-12-01), Skeen et al.
patent: D501416 (2005-02-01), Bras et al.
patent: 6928349 (2005-08-01), Namaky et al.
patent: 6940270 (2005-09-01), Chen
patent: 6941023 (2005-09-01), Shiraishi
patent: 6941203 (2005-09-01), Chen
patent: 6947816 (2005-09-01), Chen
patent: D519046 (2006-04-01), Lipscomb et al.
patent: 7073714 (2006-07-01), Namaky et al.
patent: 2002/0016655 (2002-02-01), Joeo
patent: 2003/0060953 (2003-03-01), Chen
patent: 2003/0125851 (2003-07-01), Andreasen et al.
patent: 2004/0227523 (2004-11-01), Namaky
patent: 2005/0143882 (2005-06-01), Umezawa
patent: 2006/0041348 (2006-02-01), Liebel et al.
patent: 2006/0149437 (2006-07-01), Somos
Innova Electronics Corporation; Diagnostic Equipment—OBDII Diagnostic Tools; web site (iequus.com).
Autoxray (a Subsidiary of SPX Corporation); Autoxray—CodeScout; web site (autoxray.com).

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