Scan tool

Measuring – testing – or signalling instruments – Measuring – regulating or indicating instrument – or casing – Electrical property

Design Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Design Patent

active

D0560129

CLAIM:
The ornamental design for a scan tool, as shown and described.

REFERENCES:
patent: 5491418 (1996-02-01), Alfaro et al.
patent: 5506772 (1996-04-01), Kubozono et al.
patent: 5519397 (1996-05-01), Chapotot et al.
patent: 5532927 (1996-07-01), Pink et al.
patent: 5541840 (1996-07-01), Gurne et al.
patent: 5657233 (1997-08-01), Cherrington et al.
patent: 5758300 (1998-05-01), Abe
patent: 5875413 (1999-02-01), Vinci
patent: 5916286 (1999-06-01), Seashore et al.
patent: 5935180 (1999-08-01), Fieramosca et al.
patent: 6021366 (2000-02-01), Fieramosca et al.
patent: 6061638 (2000-05-01), Joyce
patent: 6097998 (2000-08-01), Lancki
patent: 6141608 (2000-10-01), Rother
patent: 6225898 (2001-05-01), Kamiya et al.
patent: 6263268 (2001-07-01), Nathanson
patent: 6263322 (2001-07-01), Kirkevold et al.
patent: D449549 (2001-10-01), Hoelbl
patent: 6314422 (2001-11-01), Barker et al.
patent: 6359442 (2002-03-01), Henningson et al.
patent: 6370454 (2002-04-01), Moore
patent: 6389337 (2002-05-01), Kolls
patent: 6434455 (2002-08-01), Snow et al.
patent: 6459969 (2002-10-01), Bates et al.
patent: 6535802 (2003-03-01), Kramer
patent: 6594579 (2003-07-01), Lowrey et al.
patent: 6604033 (2003-08-01), Banet et al.
patent: 6611740 (2003-08-01), Lowrey et al.
patent: 6636790 (2003-10-01), Lightner et al.
patent: 6680675 (2004-01-01), Suzuki
patent: 6687584 (2004-02-01), Andreasen et al.
patent: 6701233 (2004-03-01), Namaky et al.
patent: 6718425 (2004-04-01), Pajakowski et al.
patent: 6771073 (2004-08-01), Henningson et al.
patent: 6807469 (2004-10-01), Funkhouser et al.
patent: 6823243 (2004-11-01), Chinnadurai et al.
patent: 6832141 (2004-12-01), Skeen et al.
patent: 6928349 (2005-08-01), Namaky et al.
patent: 6940270 (2005-09-01), Chen
patent: 6941023 (2005-09-01), Chen
patent: 6941203 (2005-09-01), Chen
patent: 6947816 (2005-09-01), Chen
patent: 6988053 (2006-01-01), Namaky
patent: 7012512 (2006-03-01), St. Denis
patent: 7073714 (2006-07-01), Namaky et al.
patent: 7085680 (2006-08-01), Huang
patent: RE39619 (2007-05-01), Andreasen et al.
patent: 2002/0016655 (2002-02-01), Joao
patent: 2003/0060953 (2003-03-01), Chen
patent: 2004/0227523 (2004-11-01), Namaky
patent: 2006/0041348 (2006-02-01), Liebel et al.
patent: 2006/0143882 (2006-07-01), Umezawa
Innova Electronics Corporation; Diagnostic Equipment—OBDII Diagnostic Tools; web site (iequus.com).
Autoxray (A Subsidiary of SPX Corporation); Autoxray—CodeScout; web site (autoxray.com).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scan tool does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scan tool, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scan tool will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2810325

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.