Scan testable double edge triggered scan cell

Details Scan testable double edge triggered scan cell Scan testable double edge triggered scan cell

1995-08-24

1997-07-08

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Particular stable state circuit

327199, 327203, 327211, 327212, H03K 3289, H03K 3356

Patent

active

056465670

ABSTRACT:
A scan cell is described which can function as either a positive edge triggered latch or a double edge triggered latch during normal functional operation of circuitry to be scan tested. It functions only as a positive edge triggered latch when scan testing of a logic structure is to be performed.

REFERENCES:
patent: 4629909 (1986-12-01), Cameron
patent: 5032739 (1991-07-01), Koh
patent: 5130568 (1992-07-01), Miller et al.
patent: 5172011 (1992-12-01), Leuthold et al.
patent: 5179295 (1993-01-01), Mattison et al.
patent: 5317205 (1994-05-01), Sato

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