Scan test circuit using fast transmission gate switch

Details Scan test circuit using fast transmission gate switch Scan test circuit using fast transmission gate switch

1996-10-17

1997-09-30

Trammell, James P.

Excavating

326 16, G01R 31317

Patent

active

056732775

ABSTRACT:
A fast transmission, integrated circuit switching device responsive to at least one external on/off control signal, and including a first input/output node, and a second input/output node, the switching device operative to pass or block the bidirectional transmission of external data signals between the first node and the second node, the switching device comprising a bidirectional field-effect transistor; a first scan cell; and a second scan cell; whereby input and output data signals of the switching device may be sensed and stored.

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