Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-05-20
2008-05-20
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S679000
Reexamination Certificate
active
07375535
ABSTRACT:
A capacitive sensing system (100) can connect groups of capacitive sensors (112-1to112-N) to a common node (106) to detect change in capacitance. States of a set of capacitive sensors (112-1to112-N) can thus be scanned faster than approaches that scan such sensors one-by-one. Faster scanning can allow for reduced power consumption in applications that only periodically scan the set of capacitive sensors (112-1to112-N).
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Kutz Harold
Page Andrew
Snyder Warren
Williams Tim
Cypress Semiconductor Corporation
Haverstock & Owens LLP
Nguyen Vincent Q.
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