Scan interface with TDM feature for permitting signal overlay

Data processing: structural design – modeling – simulation – and em – Emulation – In-circuit emulator

Reexamination Certificate

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Details

C703S023000, C703S027000, C714S726000, C714S727000, C714S729000

Reexamination Certificate

active

06947884

ABSTRACT:
A scan interface that includes control signals (TRST, TMS, TCK) and data signals (TDI, TDO) normally carried by respective signal paths of the scan interface can be used to carry signals other than signals of the scan interface. A first signal (TMS) and a second signal (TDO) can be time division multiplexed on the signal path that normally carries one of the signals, thereby freeing the signal path that carries the other of the signals to carry a signal other than a signal of the scan interface.

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ARM Limited, RDI 1.5.1tx and RDI 1.5.1rt; May 19, 2000; pp. 1-55.
ARM Limited, ETM9, Rev. 1, Technical Reference Manual, pp. 1-Index-3.
ARM Limited, Embedded Trace Macrocell, Rev. 1, Specification, pp. i-Index-3.

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