Scan cell designs for a double-edge-triggered flip-flop

Details Scan cell designs for a double-edge-triggered flip-flop Scan cell designs for a double-edge-triggered flip-flop

2005-09-13

2005-09-13

Lam, Tuan T. (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Particular stable state circuit

C327S211000, C327S212000

Reexamination Certificate

active

06943605

ABSTRACT:
According to some embodiments, scan cell designs are provided for a double-edge-triggered flip-flop.

REFERENCES:
patent: 5130568 (1992-07-01), Miller et al.
patent: 5646567 (1997-07-01), Felix
patent: 5656962 (1997-08-01), Banik
patent: 6300809 (2001-10-01), Gregor et al.
patent: 6348825 (2002-02-01), Galbi et al.
patent: 2003/0218488 (2003-11-01), Parulkar et al.
patent: 2004/0041610 (2004-03-01), Kundu

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