Scaled down select gates of NAND flash memory cell strings...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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Details

C365S185130, C365S185260, C365S185330

Reexamination Certificate

active

07907448

ABSTRACT:
A NAND flash memory cell string having scaled down select gates. The NAND flash memory cell string includes a first select gate that has a width of 140 nm or less and a plurality of wordlines that are coupled to the first select gate. Gates associated with the plurality of wordlines are formed of p+ polysilicon. A second select gate that has a width of 140 nm or less is coupled to the plurality of wordlines.

REFERENCES:
patent: 7365018 (2008-04-01), Higashitani et al.
patent: 7636256 (2009-12-01), Gomikawa et al.
patent: 7671475 (2010-03-01), Kamigaichi et al.
patent: 2007/0243680 (2007-10-01), Harari et al.

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