Scale correct opthamalic microscope using slit beam illumination

Details Scale correct opthamalic microscope using slit beam illumination Scale correct opthamalic microscope using slit beam illumination

1997-05-08

1999-06-15

Dang, Hung Xuan

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Objective type

351205, A61B 310

Patent

active

059127228

ABSTRACT:
The ophthalmic microscope has a slit beam light source mounted in a fixed relation to a telescopic objective lens for producing a slit beam which passes through a focal point of the objective lens in an image space before passing through the objective lens. The slit beam is thus fixed with respect to the objective lens to travel parallel to the optical axis of the objective lens in object space. The working distance can be varied without adjusting the illumination.

REFERENCES:
patent: 4669837 (1987-06-01), Schirmer

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