Scalar S-parameter test set for NMR instrumentation measurements

Details Scalar S-parameter test set for NMR instrumentation measurements Scalar S-parameter test set for NMR instrumentation measurements

1993-02-10

1994-08-09

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

324322, G01R 3300

Patent

active

053369882

ABSTRACT:
An RF device (A) under test is connected with ports or jacks (14, 16) of an S-parameter test set (B). An RF input jack (18) is connected with an RF tracking signal output (20) of a spectrum analyzer (C) to receive an RF tracking signal. An output jack (22) is connected with a receiver input (24) of the spectrum analyzer. A mode control (30) internal to the test set is controlled by a programmable control sequence generator (34) of the spectrum analyzer. The mode control controls a switch array (32), preferably PIN diodes, which interconnect the RF input jack (18), the RF output jack (22), the two jacks (14, 16) that are connected to the device under test, and a 50 Ohm termination (54) in four modes to make reflection measurements and two transmission measurements. DC bias jacks (26, 28) are connected with a DC power for injecting a DC component into the RF signals applied to the device under test.

REFERENCES:
patent: 5241272 (1993-08-01), Axel
patent: 5258718 (1993-11-01), Duerr

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