Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2003-04-15
2009-10-13
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C374S141000, C327S512000
Reexamination Certificate
active
07600913
ABSTRACT:
A system for measuring a temperature of an electrical device is provided. The system comprises a transistor and a microprocessor. The transistor is part of an electrical device and is operable to perform a first function for the electrical device. For example, the transistor is operable in a saturated state to control activation of a pre-charge circuit in an electronic power assisted steering system. The microprocessor is responsive to a voltage at the transistor. The voltage of the transistor varies as a function of temperature (i.e., heat emitted from the electrical device). The microprocessor is operative to determine a temperature of the electrical device as a function of the voltage, where the sensing of temperature of the electrical device is different than the first function.
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Khaykin Boris
Rutkowski Dave
Brinks Hofer Gilson & Lione
Jagan Mirellys
tedrive Holding B.V.
Verbitsky Gail
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