Geometrical instruments – Gauge – Work support adjustment
Reexamination Certificate
2006-08-04
2008-09-09
Fulton, Christopher W (Department: 2841)
Geometrical instruments
Gauge
Work support adjustment
Reexamination Certificate
active
07421795
ABSTRACT:
A metrology system comprises a support structure, a fixture having a bottom surface resting on a surface of the support structure and moveable relative to the support structure, and a first measurement assembly for interacting with a workpiece held by the fixture to measure a characteristic of the workpiece. One of the bottom surface of the fixture and the surface of the support structure comprises sapphire, and the other of the bottom surface of the fixture and the surface of the support structure comprises a metal.
REFERENCES:
patent: 3831283 (1974-08-01), Pagella et al.
patent: 4631834 (1986-12-01), Hayashi et al.
patent: 4676649 (1987-06-01), Phillips
patent: 4778313 (1988-10-01), Lehmkuhl
patent: 5068972 (1991-12-01), Herzog et al.
patent: 5088208 (1992-02-01), Wells et al.
patent: 5682682 (1997-11-01), Renfrew et al.
patent: 5705741 (1998-01-01), Eaton et al.
patent: 6260282 (2001-07-01), Yuan et al.
patent: 7159327 (2007-01-01), Baruchello et al.
patent: 7350308 (2008-04-01), Mysore et al.
patent: 2007/0137056 (2007-06-01), Mysore et al.
Gonzalez Steve G.
Mysore Ananda V.
Darby & Darby PC
Fulton Christopher W
Seagate Technology LLC
LandOfFree
Sapphire alignment fixture does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sapphire alignment fixture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sapphire alignment fixture will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3982353