Sampling-type optical voltage detector utilizing movement of int

Details Sampling-type optical voltage detector utilizing movement of int Sampling-type optical voltage detector utilizing movement of int

1992-03-26

1995-01-24

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, G01B 902

Patent

active

053846389

ABSTRACT:
Polarized light pulses are applied to an optical modulator including an electrooptic crystal. A polarization state of the applied light is changed in accordance with a voltage of an electrical signal applied to the optical modulator. A polarization interferometer receives the light output from the optical modulator, and generates an interference fringe on the input surface of a photodetector such as a one-dimensional CCD. A processing device calculates a pitch and a movement distance of the interference fringe, based on an output signal of the photodetector, to determine the voltage. A waveform of the electrical signal is determined by sampling the electrical signal with multiple light pulses, while varying a phase relationship between the electrical signal and the light pulses.

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