Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-03-15
1997-03-25
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
364822, 364713, 364807, G01R 2317, G01R 104, G06G 900, G01B 902
Patent
active
056148348
ABSTRACT:
A Golay sampling receiver is used for optical sampling of voltage and charge at the internal nodes of analog and digital integrated circuits. The sampling receiver uses very high sampling rates together with narrow banding to recover very small signals in the presence of noise. The sampling system is based on harmonic mixing, which is the interaction of a laser sampling train with the electro-optic modulator formed in the GaBs substrate of the device under test. The application of the Golay sampling receiver to an electro-optic sampling system allows the flexibility of running the signal under test at a subharmonic of the laser pulse repetition rate, as well as any harmonic of these subharmonics. The subharmonics are determined by the length code used in the Golay receiver. For a given signal to be sampled, the fundamental frequency is chosen to be a function of the fixed sample rate divided by the code length, and the baseband offset.
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Weingarten Kurt J. et al, "Picosecond Optical Sampling of GaAs Integrated Circuits", IEEE Journal of Quantum Electronics, vol. 24, No. 2, Feb. 1988, pp. 198-218.
Heinrich, H.K. et al, "Noninvasive sheet charge density probe for integrated silicon devices", Appl. Phys. Lett. 48 (16), 21 Apr. 1986, pp. 1066-1068.
Apte Raj B.
Black Alistair
Bloom David M.
Auton William G.
Bowser Barry C.
The United States of America as represented by the Secretary of
Wieder Kenneth A.
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