Sampling methods and systems that shorten readout time and...

Radiant energy – Source with recording detector – Using a stimulable phosphor

Reexamination Certificate

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C358S296000

Reexamination Certificate

active

07005663

ABSTRACT:
Sampling methods and systems that shorten readout time and reduce lag in amorphous silicon flat panel x-ray detectors are described. Embodiments comprise: (a) activating a reset switch to discharge any residual signal being held in a feedback capacitor; (b) deactivating the reset switch; (c) activating a field effect transistor; (d) sampling an electrical signal from the amorphous silicon flat panel x-ray detector, while the field effect transistor is activated; (e) activating a reset switch, after the electrical signal has been sampled and while the field effect transistor is still activated, to discharge any residual signal being held in the feedback capacitor; (f) deactivating the field effect transistor, while the reset switch is still activated; (g) deactivating the reset switch; and (h) repeating steps (c)–(g) as necessary to obtain a predetermined radiographic image.

REFERENCES:
patent: 4996413 (1991-02-01), McDaniel et al.
patent: 5812191 (1998-09-01), Orava et al.
patent: 6353654 (2002-03-01), Granfors et al.
patent: 2002/0085667 (2002-07-01), Miller

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