Measuring and testing – Sampler – sample handling – etc. – With heating or cooling
Patent
1997-09-17
1998-11-10
Raevis, Robert
Measuring and testing
Sampler, sample handling, etc.
With heating or cooling
G01N 114
Patent
active
058346562
ABSTRACT:
Sampling interfaces and methods of operation thereof having increased duty cycles and pressure equalizations that improve sensing of airborne metals in air samples fed to a continuous emissions monitor. Residual pressure in one or two sample reservoirs (loops) can be automatically equalized just prior to pneumatic connection between each sample reservoir loop and plasma in a plasma torch, thus minimizing or eliminating perturbation of the plasma. Deliberate sequential activation of valves allows each sample reservoir loop to be first isolated from the vacuum pump, and then momentarily as its pressure is equalized, it remains isolated from the plasma as well. Finally, pneumatic connection is made between each sample reservoir loop and the plasma allowing the contents of each sample reservoir (now at the same pressure as the plasma) to be transported into the plasma. Sampling interface having dual elongate sample reservoirs that alternate aliquots of sample air nearly doubles the rate of measurement of air entrained metals relative to a single elongate reservoir loop arrangement. By allowing measurements to be made at more frequent intervals using more representative sampling of extracted flue gases or air, the dual loops may permit the acquisition of hazardous emissions monitoring data that is more meaningful in terms of its temporal characteristics.
REFERENCES:
patent: Re29304 (1977-07-01), Greenfield et al.
patent: 3965747 (1976-06-01), McCorckle
patent: 3965748 (1976-06-01), Boubel et al.
patent: 4091835 (1978-05-01), Frampton
patent: 4159635 (1979-07-01), Sehmel
patent: 4272483 (1981-06-01), Schick
patent: 4293220 (1981-10-01), Denton et al.
patent: 4390772 (1983-06-01), Hiratake
patent: 4470316 (1984-09-01), Jiskoot
patent: 4482246 (1984-11-01), Meyer et al.
patent: 4566342 (1986-01-01), Kurz
patent: 4649760 (1987-03-01), Wedding
patent: 4739147 (1988-04-01), Meyer et al.
patent: 4823622 (1989-04-01), Nohl et al.
patent: 5012065 (1991-04-01), Rayson et al.
patent: 5090257 (1992-02-01), Bruce
patent: 5479254 (1995-12-01), Woskov
patent: 5526110 (1996-06-01), Braymen
J.D. Chase Theoretical and Experimental Investigation of Pressure and Flow n Induction Plasmas, journal of Applied Physics. nov. 1971 vol. 42, No. 12, pp. 4870-4879.
D. Truitt & J.W. Robinson Spectroscopic Studies of Organic Compunds Introduced into a Radio Frequency Induced Plasma. Analytica Chemica Acta, 51-1970 pp. 61-67 Elsevier Publishing Company, Amsterdam.
Seltzer, Michael D. An Argon ICP-Based Continous Emissions Monitor for Hazardous Air Pollutant Metals: Field Demonstration Presentation of the Ari Waste Management Association. 90th Annual Management Exhibition.
Seltzer, Michael D. An Inductively Coupled Argon Plasma Continous Emissions Monitor forHazordous Air Pollutant Metals, Environmental Science and Technology Sept. 1997. submitted April 1997.
Seltzer, Michael D & Gerhard A. Meyer, Keeping and Eye on Metals Emissions, Environemntal Protection, Jun. 1997 vol. 8 No. 6--26-29.
Seltzer, Michael D. Continous Air Monitoring Using Inductively Coupled Plasma, Applied Spectorscopy, Submitted Jun. 1997.
Emissions Measurement Branch, nsps Test Method, EMTIC M-002 Technical Support Division, QAQPS, EPA, NAWS China Lake.
Church Stephen J.
Raevis Robert
Sliwka Melvin J.
The United States of America as represented by the Secretary of
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