Sample supply device and sample inspection apparatus using the d

Details Sample supply device and sample inspection apparatus using the d Sample supply device and sample inspection apparatus using the d

1990-06-29

1993-01-26

McGraw, Vincent P.

Optics: measuring and testing

For light transmission or absorption

Of fluent material

356 39, 356336, 356410, 137 93, 137112, G01N 2105

Patent

active

051826178

ABSTRACT:
A sample supply device includes first and second sample supply means for independently receiving respective samples via a common channel and for supplying the samples to an inspection position. The device is controlled so that the second sample supply means performs a sample receiving operation and/or a washing operation with the channel, while the first sample supply means supplies the sample to the inspection position. A sample inspection apparatus inspects the sample at the inspection position principally using an optical method.

REFERENCES:
patent: 3604814 (1971-09-01), Skeggs
patent: 4606631 (1986-08-01), Anno et al.
patent: 4854838 (1989-08-01), Swain

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