Sample retainer for x-ray fluorescence analysis, x-ray...

X-ray or gamma ray systems or devices – Specific application – Fluorescence

Reexamination Certificate

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C378S066000, C378S045000, C422S051000

Reexamination Certificate

active

07016463

ABSTRACT:
To provide a sample retainer for X-ray fluorescence analysis, which is used in pretreating a liquid sample and then in X-ray fluorescence analysis of contents of such liquid sample, can sufficiently improve the limit of detection by suppressing the background and, also, allowing the fluorescent X-rays of a high intensity to be emitted uniformly, the sample retainer5comprises a ring-shaped pedestal2; a hydrophobic film3of a thickness smaller than 10 μm and having a peripheral portion3aheld by the pedestal and also having a transmitting portion3bfor passage of X-rays therethrough; and a sheet-like liquid absorbent element4applied to the transmitting portion3bof the hydrophobic film3and having a thickness within the range of 1 to 100 μm; wherein a liquid sample1is adapted to be dispensed dropwise onto and dried on the liquid absorbent element4bwith contents of the liquid sample1consequently retained thereon.

REFERENCES:
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patent: 4595561 (1986-06-01), Thornton et al.
patent: 5958345 (1999-09-01), Turner et al.
patent: 2001/0024805 (2001-09-01), Williams et al.
Patent Astracts of Japan, Publication No. 2003-090810, Mar. 28, 2003; Nakamura Hideki.
Patent Abstracts of Japan, Publication No. 2003-090810; Mar. 28, 2003; Shimadzu Corp.
Patent Abstracts of Japan, Publication No. 07-055733; Mar. 3, 1995; Rigaku Ind Co.
“Keiko x-sen ni yoru Suiyoekichu no Biryo Genso no Bunseki”, Takao Moriyama, et al., The Society of Chemical Engineers, Japan Dai 69, Mar. 2, 2004; p. 759.

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