Sample positioning method and system for X-ray spectroscopic ana

Details Sample positioning method and system for X-ray spectroscopic ana Sample positioning method and system for X-ray spectroscopic ana

1989-08-07

1990-11-27

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 83, G01N 23223

Patent

active

049742442

ABSTRACT:
A method of positioning a sample for X-Ray spectroanalysis at a spectroscopic machine that includes the steps of determining the point of primary focus of an X-Ray beam upon a master grid and then placing the data upon a mating assembly grid that is positioned in an assembly well into which is positioned a grid support that carries the assembly grid with the primary focus point. Further steps include assembling a sample holder with one sheet of film in the assembly well. An interlocking member that locks the sample holder into interlocking relationship with both the grid support and the sample holder is then inserted into the well. The sample is then aligned upon the point of primary focus upon the film in the fixed sample holder. The sample holder is removed from engagement with the interlocking member and transferred to the sample holder support plate at the spectroscopic machine where the sample is aligned with the primary focus. The sample holder can be optionally mounted with two sheets of film sandwiching the sample at the well.

REFERENCES:
patent: 4037109 (1977-07-01), Hosokawa et al.
patent: 4445225 (1984-04-01), White
patent: 4448311 (1984-05-01), Houser
patent: 4575869 (1986-03-01), Torrisi et al.
patent: 4587666 (1986-05-01), Torrisi et al.
patent: 4698210 (1987-10-01), Solazzi

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