Sample movement control unit, sample movement parameters...

Details Sample movement control unit, sample movement parameters... Sample movement control unit, sample movement parameters...

2005-02-18

2010-06-01

Williams, Hezron (Department: 2856)

Measuring and testing

Sampler, sample handling, etc.

Automatic control

Reexamination Certificate

active

07726210

ABSTRACT:
There is provided a device and a method capable of simply manipulating a sample, without the need for an expensive device.A device of the present invention comprises a pipette4, and vibration section5, a control section7and a storage section8. At least part of the pipette4will be disposed within a liquid2. The control section5causes the pipette4to vibrate. The control section7supplies vibration signals to the vibration section5. The storage section8stores parameters for generating vibration signals. These parameters include information for generating a first vibrating wave causing a wave motion for drawing a particular sample3being within a specified distance from a tip of the pipette4to occur within a liquid2, and information for generating a second vibrating wave causing a wave motion for rotating the drawn in sample3to occur. The information for generating the first standing wave and the information for generating the second standing wave are, for example, amplitude and frequency of vibration.

REFERENCES:
patent: 6945129 (2005-09-01), Escal
patent: 2003/0077815 (2003-04-01), Omata
patent: 2001239500 (2001-09-01), None
Inoue, Y., et al., “An Ultra Precision Production System Organized by Multiple Micro Robots,” Seimitsu Kogakkai Taikai Gakujutsu Koenkai Koen Ronbunshu, vol. 2004, Shunki (CD-ROM), Mar. 1, 2004, p. MO1.
Chiba, N., et al., “An Ultra Precision Production System Organized by Multiple Micro Robots,” Seimitsu Kogakkai Taikai Gakujutsu Koenkai Koen Ronbunshu, vol. 2004, Shuki (CD-ROM), Sep. 1, 2004, p. LO3.

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