Sample masking using wavelength-selective material

Optical: systems and elements – Having significant infrared or ultraviolet property

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Details

250339, 359353, 359389, G02B 520, G02B 2106

Patent

active

052950174

ABSTRACT:
An adjustable masking mechanism for use in connection with the exposure of a sample to a beam of analytical radiation and a beam of viewing radiation that facilitates aligning the movable elements of the mask with the edges of the sample. Whereas the prior art mechanisms utilize materials that are opaque to both the analytical radiation and the viewing radiation, the present invention uses one or more movable elements that are substantially opaque to the analytical radiation and at least partially transmissive to at least a portion of the spectral range of the viewing radiation.

REFERENCES:
patent: 3558221 (1971-01-01), Jessup
patent: 3610735 (1971-10-01), Girard
patent: 4158504 (1979-06-01), De Ponteves et al.
patent: 4280057 (1981-07-01), Takahama et al.
patent: 4810077 (1989-03-01), Sting
patent: 4893886 (1990-01-01), Ashkin et al.
patent: 4922282 (1990-05-01), Koyama et al.
patent: 5035472 (1991-07-01), Hansen
patent: 5084780 (1992-01-01), Phillips
patent: 5089909 (1992-02-01), Kleinberg
patent: 5239409 (1993-08-01), Doyle et al.

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