Measuring and testing – Instrument proving or calibrating – Roughness or hardness
Reexamination Certificate
2011-03-01
2011-03-01
Raevis, Robert R (Department: 2856)
Measuring and testing
Instrument proving or calibrating
Roughness or hardness
Reexamination Certificate
active
07895879
ABSTRACT:
The invention generally relates to atomic resolution imaging, and, more particularly, to systems and methods for calibrating an atomic resolution measurement tool. A sample holder for holding test samples used in measuring linearity of an atomic force microscope is provided. The holder includes a body having a top surface, and a plurality of inclined regions formed in the body and spaced apart along the top surface. Each of the inclined regions is structured and arranged to hold a test sample used to measure linearity of an atomic force microscope at one of a plurality of predefined angles.
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Canale Anthony
International Business Machines - Corporation
Raevis Robert R
Roberts Mlotkowski Safran & Cole P.C.
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