Sample holder for differential thermal analysis

Details Sample holder for differential thermal analysis Sample holder for differential thermal analysis

2005-08-30

2005-08-30

Gutierrez, Diego (Department: 2859)

Thermal measuring and testing

Differential thermal analysis

Detail of sample holder or support therefor

C374S013000, C136S225000

Reexamination Certificate

active

06935776

ABSTRACT:
A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.

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patent: 5842788 (1998-12-01), Danley et al.
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patent: 6318890 (2001-11-01), Hutter et al.
patent: 6390669 (2002-05-01), Nakamura et al.
patent: 6508585 (2003-01-01), Nakamura et al.
patent: 2002/0021740 (2002-02-01), Danley
patent: 690627 (2000-11-01), None
patent: 0962763 (1999-12-01), None
patent: 1215484 (2002-06-01), None

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