Sample chamber for a spectro photometer

Details Sample chamber for a spectro photometer Sample chamber for a spectro photometer

1992-01-31

1994-04-26

Rosenberger, Richard A.

Optics: measuring and testing

By monitoring of webs or thread

For flaws or imperfections

356244, 356435, G01N 2101

Patent

active

053071557

ABSTRACT:
A spectro photometer deflects a measuring beam off its original axis to pass through a long sample, and returns the measuring beam to its final direction after passing through the sample. The sample is guided along a path which is clear of a reference beam of the spectro photometer. This arrangement permits double-beam measurement of long samples, with good signal-to-noise ratio. Deflection is accomplished using a plurality of mirrors.

REFERENCES:
patent: 3361025 (1968-01-01), Gaffard
patent: 3563667 (1971-02-01), Koskimines et al.
patent: 3841761 (1974-10-01), Selgin
patent: 4848904 (1989-07-01), Sapp et al.

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