Sample analyzing instrument using first and second plasma torche

Details Sample analyzing instrument using first and second plasma torche Sample analyzing instrument using first and second plasma torche

1993-12-14

1994-11-22

Hannaher, Constantine

Radiant energy

Ionic separation or analysis

With sample supply means

250281, H01J 4902

Patent

active

053671635

ABSTRACT:
An analytical instrument using a plasma is disclosed. The instrument includes two plasma torches, a first torch of which is used for vaporizing a sample and a second plasma torch is used for exciting the sample. When the analytical instrument is a mass spectrometer, the sample vaporized by the first plasma torch is introduced into the second plasma torch where the sample is ionized. The sample is then mass analyzed. If the sample is a small solid sample, it is momentarily vaporized by the plasma flame generated from the first plasma torch. If the sample is a large solid sample, it can be gradually vaporized from its surface. Therefore, the sample can be analyzed without requiring any pretreatment, e.g., dissolving the sample in an acid.

REFERENCES:
patent: 4760253 (1988-07-01), Hutton
patent: 4886966 (1989-12-01), Matsunaga et al.
patent: 4999492 (1991-03-01), Nakagawa
patent: 5051584 (1991-09-01), Gray et al.
patent: 5223711 (1993-06-01), Sanderson et al.
patent: 5308977 (1994-05-01), Oishi et al.

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