Optics: measuring and testing – For light transmission or absorption – Of fluent material
Reexamination Certificate
2007-03-30
2011-11-22
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
For light transmission or absorption
Of fluent material
C356S414000, C356S418000, C422S063000, C422S064000
Reexamination Certificate
active
08064061
ABSTRACT:
A sample analyzer is disclosed that comprising: a light source section for emitting light; a first optical information acquiring section for illuminating a sample with the light emitted by the light source section, and for acquiring first optical information; and a second optical information acquiring section for illuminating a measurement specimen, to be prepared by adding a reagent to the sample, with the light emitted by the light source section, and for and acquiring second optical information. A sample analyzing method, intended for use in an automated sample analyzer, is also described.
REFERENCES:
patent: 3609042 (1971-09-01), Yasuda et al.
patent: 4208353 (1980-06-01), Webster et al.
patent: 4313735 (1982-02-01), Yamashita et al.
patent: 4451433 (1984-05-01), Yamashita et al.
patent: 4528159 (1985-07-01), Liston
patent: 4668617 (1987-05-01), Furuta et al.
patent: 4684252 (1987-08-01), Makiguchi et al.
patent: 4685801 (1987-08-01), Minekane
patent: 4774055 (1988-09-01), Wakatake et al.
patent: 4778763 (1988-10-01), Makiguchi et al.
patent: 4896963 (1990-01-01), Kato
patent: 5587129 (1996-12-01), Kurosaki et al.
patent: 5698450 (1997-12-01), Ringrose et al.
patent: 5734468 (1998-03-01), McNeal
patent: 6353471 (2002-03-01), Samsoondar et al.
patent: 6388750 (2002-05-01), Liu et al.
patent: 6409968 (2002-06-01), Takahashi
patent: 6797518 (2004-09-01), Jacobs et al.
patent: 2005/0259261 (2005-11-01), Harada et al.
patent: 2007/0222973 (2007-09-01), Hoshiko et al.
patent: 2008/0070318 (2008-03-01), Yamamoto et al.
patent: 0 355 738 (1990-02-01), None
patent: 2-223859 (1990-09-01), None
patent: 6-265554 (1994-09-01), None
patent: 7-58263 (1995-06-01), None
patent: 7-280814 (1995-10-01), None
patent: 10-170444 (1998-06-01), None
patent: 10-274656 (1998-10-01), None
patent: 3229498 (2001-09-01), None
patent: 98/21564 (1998-05-01), None
Matsuo Naohiko
Yamamoto Norimasa
Yamato Takashi
Nguyen Sang
Sughrue & Mion, PLLC
Sysmex Corporation
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