Sample analyzer and sample analyzing method

Details Sample analyzer and sample analyzing method Sample analyzer and sample analyzing method

2011-06-14

2011-06-14

Barbee, Manuel L (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Chemical analysis

C702S032000, C356S039000, C436S069000

Reexamination Certificate

active

07962292

ABSTRACT:
A sample analyzer optically measures reaction of a sample mixed with reagent, and obtains optical information therefrom; generates a reaction curve representing change in the optical information over time; determines a first area prior to an evaluation target time (t0) and a second area after the evaluation target time (t0) wherein the first and second areas are formed between a baseline which is parallel to the time axis and a reaction curve from a first time (t1) prior to the optional evaluation target time (t0) to a second time (t2) after the evaluation target time, and determines the reaction end point based on the first and second areas; and obtains a characteristic of a sample based on the determined reaction end point, is disclosed. a sample analyzing method is also disclosed.

REFERENCES:
patent: 3963909 (1976-06-01), Atwood et al.
patent: 4217107 (1980-08-01), Saito et al.
patent: 7276376 (2007-10-01), Katayama et al.
patent: 06-249855 (1994-09-01), None
patent: 10-123140 (1998-05-01), None
Office Action from counterpart Chinese Application No. 200810004754.9, dated Aug. 7, 2009, 2 pages (translation).

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